缩进
材料科学
相(物质)
衍射
三角晶系
压缩(物理)
凝聚态物理
硅
结晶学
光学
晶体结构
复合材料
物理
光电子学
化学
量子力学
作者
Sherman Wong,Bianca Haberl,Brett C. Johnson,A. Mújica,M. Guthrie,Jeffrey C. McCallum,J. S. Williams,J. E. Bradby
标识
DOI:10.1103/physrevlett.122.105701
摘要
The rhombohedral phase of Si (r8-Si), a promising semiconducting material, is formed by indentation together with the body-centered cubic phase (bc8-Si). Using a novel sample preparation method, x-ray diffraction is used to determine the relative volume of these phases in indented Si and allow observation of a distorted unit cell along the direction of indentation loading. Theoretical calculations together with these observations suggest the indent contains an intrinsic compression of ∼4 GPa that stabilizes the r8 phase.
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