钙钛矿(结构)
薄膜
材料科学
带隙
扫描电子显微镜
分析化学(期刊)
半最大全宽
纳米颗粒
相(物质)
纳米技术
结晶学
光电子学
复合材料
化学
色谱法
有机化学
作者
Rekha Yadav,Mrinmoy Roy,Gangadhar Banappanavar,Mohammed Aslam
标识
DOI:10.1002/asia.202200087
摘要
Abstract Herein, we demonstrate a vacuum‐based evaporation approach to fabricate organic‐inorganic perovskite thin films by using phase‐formed halide perovskite nanoparticles (NPs) as a precursor/source. We are able to consistently obtain MAPbX 3 (MA=CH 3 NH 3 and X=Cl, Br or I) thin films at various substrates (e. g., glass, ITO, or plastic). The perovskite phase formation in thin film form is confirmed by x‐ray diffraction (XRD) studies. Small micro‐strain (tensile) values of 1.64×10 −3 , 1.42×10 −3 and 6.85×10 −4 obtained for MAPbCl 3 , MAPbBr 3 and MAPbI 3 films respectively from Williamson‐Hall equation indicate low structural distortions in perovskite thin films. The absorption spectra of thin films show sharp band edge having direct band gap, which is followed by narrow full width at half maxima (FWHM ∼0.1 eV) of the emission peak. Thin films of MAPbCl 3 , MAPbBr 3 and MAPbI 3 show direct band gap of 3.1 eV, 2.4 eV and 1.6 eV, respectively. Small Urbach energy values of 33 meV, 44 meV and 66 meV for MAPbCl 3 , MAPbBr 3 and MAPbI 3 films respectively indicates low defect density in various perovskite films. Scanning electron microscopy (SEM) along with energy‐dispersive X‐ray spectroscopy (EDS) shows high surface coverage and uniform chemical composition of MAPbX 3 (X=Cl, Br and I) thin films deposited by the present method. We have successfully controlled the film thickness from 250 nm to 1 μm by varying the nanoparticle precursor amount. The perovskite thin films deposited by the present method are highly stable against the degradation under ambient conditions. Systematic XRD studies along with absorption data demonstrate that the MAPbCl 3 and MAPbBr 3 films stored under ambient conditions remained stable for more than 30 days and MAPbI 3 films for more than 7 days.
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