佩多:嘘
氧化铟锡
材料科学
铟
聚(3,4-亚乙基二氧噻吩)
有机发光二极管
导电聚合物
阳极
退火(玻璃)
聚合物
化学工程
光电子学
兴奋剂
纳米技术
复合材料
薄膜
电极
图层(电子)
化学
物理化学
工程类
作者
M. P. de Jong,L.J. van IJzendoorn,M.J.A. de Voigt
摘要
A cause for degradation of polymer light-emitting diodes is the oxidation of the polymer by oxygen diffusing out of the indium-tin-oxide (ITO) anode. This problem can be solved by the introduction of an organic hole-injecting film, poly-(3,4-ethylenedioxythiophene) (PEDOT) doped with poly(styrenesulfonate) (PSS), between the ITO and the emissive polymer. Indeed, a dramatic improvement of the lifetime and also the luminous efficiency has been observed. However, our Rutherford backscattering (RBS) studies show that the ITO/PEDOT:PSS interface is not stable. In as prepared glass/ITO/PEDOT:PSS samples 0.02 at. % indium was found in the PEDOT:PSS film. Annealing in a nitrogen atmosphere at 100 °C during 2500 h increased the indium concentration to 0.2 at. %. Upon exposure to air much faster degradation of the ITO/PEDOT:PSS interface was observed; after several days in air the amount of indium reached a saturation concentration of 1.2 at. %. The degradation of the interface can be explained by etching of the ITO due to the strong acidic nature of PEDOT:PSS.
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