晶界
密度泛函理论
扫描隧道显微镜
六方氮化硼
氮化硼
材料科学
电子结构
结晶学
硼
凝聚态物理
化学物理
纳米技术
化学
计算化学
物理
微观结构
石墨烯
有机化学
作者
Qiucheng Li,Xiaolong Zou,Mengxi Liu,Jingyu Sun,Yabo Gao,Yue Qi,Xiebo Zhou,Boris I. Yakobson,Yanfeng Zhang,Zhongfan Liu
出处
期刊:Nano Letters
[American Chemical Society]
日期:2015-08-07
卷期号:15 (9): 5804-5810
被引量:121
标识
DOI:10.1021/acs.nanolett.5b01852
摘要
Grain boundaries (GBs) of hexagonal boron nitride (h-BN) grown on Cu(111) were investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The first experimental evidence of the GBs composed of square-octagon pairs (4|8 GBs) was given, together with those containing pentagon-heptagon pairs (5|7 GBs). Two types of GBs were found to exhibit significantly different electronic properties, where the band gap of the 5|7 GB was dramatically decreased as compared with that of the 4|8 GB, consistent with our obtained result from density functional theory (DFT) calculations. Moreover, the present work may provide a possibility of tuning the inert electronic property of h-BN via grain boundary engineering.
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