锭
薄脆饼
硅
基质(水族馆)
材料科学
位错
光电子学
载流子寿命
杂质
生产成本
光伏系统
工程物理
纳米技术
冶金
工程类
复合材料
电气工程
机械工程
化学
地质学
海洋学
有机化学
合金
作者
Jie Huang,Shuai Yuan,Xuegong Yu,Deren Yang
标识
DOI:10.1002/pssa.202200448
摘要
Cast‐mono silicon (CM‐Si) is a promising substrate to fabricate cost‐effective photovoltaic (PV) wafers used for solar cells with higher efficiency compared with conventional cast multicrystalline silicon (mc‐Si) due to its high throughput and good ingot quality. However, the unavoidable appearance of defects like dislocation, subgrain boundaries, impurities, multicrystallization, and twins, seriously limits its mass‐scale applications in the PV industry. In this review, the growth characteristics of the CM‐Si method are introduced first. Then, the attention is focused on the defects in CM‐Si. Other issues related to production costs that restrict the development of CM‐Si are also addressed in detail, such as seed cost and recycled seeds, n‐type CM‐Si, and large‐size CM‐Si. Finally, a conclusion is made and the prospects are given about the CM‐Si technique.
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