烧结
可靠性(半导体)
材料科学
涂层
纳米技术
冶金
微观结构
物理
量子力学
功率(物理)
作者
Jintao Wang,Si Chen,Luobin Zhang,Xueting Zhao,Fangcheng Duan,Hongtao Chen
标识
DOI:10.1007/s11664-021-09078-1
摘要
In this review, the present status of nanosilver sintering is adapted in detail. This review shows the current scholarly exploration and achievements in this field through the two aspects of manufacturing and reliability. The preparation of nanosilver particles, organic coating and sintering methods, microstructure and failure modules of sintered nanosilver layers are described in detail. Finally, prospects and dilemmas of nanosilver sintering technology as a connection material for semiconductor devices and the directions of future extensions are discussed.
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