六方氮化硼
材料科学
原子物理学
密度泛函理论
氮化硼
六方晶系
电荷(物理)
图层(电子)
硼
GSM演进的增强数据速率
分子物理学
结晶学
物理
计算化学
化学
纳米技术
量子力学
电信
石墨烯
计算机科学
核物理学
作者
Lichang Yin,Hui‐Ming Cheng,Riichiro Saito
标识
DOI:10.1103/physrevb.81.153407
摘要
Triangle defect states of hexagonal boron nitride ($h$-BN) atomic layer were studied by a density functional theory calculation. N(B) triangle defect states of $h$-BN atomic layer with N(B) edge atoms have acceptor (donor) levels. A cohesive energy calculation indicates that the $h$-BN atomic layer with N triangle defects is more or less stable, respectively, than that with B triangle defects when it is negatively or positively charged, which is consistent with the recent experimental observation of N triangle defects in $h$-BN atomic layer. Charge population analysis shows that the edge N(B) atoms surrounding the N(B) triangle defect are negatively (positively) charged. Such a charged triangle defects in $h$-BN may serve as a potential nanolens for electron-beam focusing.
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