扫描隧道显微镜
材料科学
电荷密度波
插层(化学)
凝聚态物理
电子结构
兴奋剂
化学物理
铜
相(物质)
扫描透射电子显微镜
Atom(片上系统)
量子隧道
结晶学
纳米技术
透射电子显微镜
超导电性
化学
光电子学
无机化学
物理
有机化学
计算机科学
冶金
嵌入式系统
作者
Wenhao Zhang,Degong Ding,Jingjing Gao,Kunliang Bu,Zongxiu Wu,Li Wang,Fangsen Li,Wei Wang,Xuan Luo,W. J. Lu,Chuanhong Jin,Yuping Sun,Yi Yin
出处
期刊:Nano Research
[Springer Nature]
日期:2022-01-15
卷期号:15 (5): 4327-4333
被引量:4
标识
DOI:10.1007/s12274-021-4034-3
摘要
Intercalation is an effective method to modify physical properties and induce novel electronic states of transition metal dichalcogenide (TMD) materials. However, it is difficult to reveal the microscopic electronic state evolution in the intercalated TMDs. Here we successfully synthesize the copper-intercalated 1T-TaS2 and characterize the structural and electronic modification combining resistivity measurements, atomic-resolution scanning transmission electron microscopy (ADF-STEM), and scanning tunneling microscopy (STM). The intercalated Cu atom is determined to be directly below the Ta atom and suppresses the commensurate charge density wave (CCDW) phase. Two specific electronic modulations are discovered in the near-commensurate (NC) CDW phase: the electron doping state near the defective star of Davids (SDs) in metallic domains and the spatial evolution of the Mott gap in insulating domains. Both modulations reveal that intercalated Cu atoms act as a medium to enhance the interaction between intralayer SDs, in addition to the general charge transfer effect. It also solidifies the Mott foundation of the insulating gap in pristine samples. The intriguing electronic evolution in Cu-intercalated 1T-TaS2 will motivate further exploration of novel electronic states in the intercalated TMD materials.
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