MOSFET
碳化硅
切换时间
电气工程
CMOS芯片
拓扑(电路)
晶体管
材料科学
计算机科学
电子工程
电压
工程类
冶金
作者
Zaojun Ma,Yunqing Pei,Laili Wang,Qingshou Yang,Zhiyuan Qi,Guanghui Zeng
出处
期刊:IEEE Transactions on Power Electronics
[Institute of Electrical and Electronics Engineers]
日期:2022-01-01
卷期号:38 (3): 3281-3297
标识
DOI:10.1109/tpel.2022.3219241
摘要
Nanosecond output pulse and high efficiency are achieved in high-voltage pulsed power supplies (HVPPSs) by applying silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors ( mosfet s), whose switching speed and switching loss are two vital characteristic parameters. However, the existing research on switching characteristics of SiC mosfet s is mainly based on the double pulse test circuits with inductive loads, which is not suitable for assessing the devices in HVPPSs with resistive loads. Besides, some simplified analytical methods in HVPPSs lead to poor precision. To accurately predict the switching behavior of SiC mosfet s in HVPPSs for guiding the design of gate driving circuits and power loops, this article proposes an accurate analytical model considering parasitic inductances, nonlinear parasitic capacitances, transfer characteristic, and output characteristics of SiC mosfet s. High-precision fitting of transfer characteristic is realized by using the Gaussian function. Besides, the dynamic parasitic gate-drain capacitance is measured by experiment, and three-dimensional curve fitting is performed on the output characteristics to exactly represent on -resistance. Furthermore, switching speed and switching loss can be directly calculated according to the solved state variables. Finally, the analytical model is verified by experiment, and the effects of gate driving circuits and power loops on switching characteristics are researched in detail.
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