薄脆饼
云纹
材料科学
叠加原理
晶片键合
不透明度
光电子学
光学
干涉测量
计算机科学
电子工程
工程类
物理
量子力学
作者
Xiaoyun Qi,Han Yan,Shicheng Zhou,Qiushi Kang,Chenxi Wang
标识
DOI:10.1109/icta53157.2021.9661731
摘要
Wafer bonding alignment is one of the most important manufacturing processes in 3D integration, especially in high-density interconnection. A nanoprecision alignment system based on moiré fringes suitable for both optical transparent or opaque advanced wafers is proposed and named MoiréView. Moiré fringes are sensitive to gratings superposition status and beneficial for improving the accuracy into the nanoscale. The alignment system, which contains optical part, mechanical handling part, and signal process part, is developed to align bonding wafers without transparency requirements. The alignment operation includes optical system calibration, wafer position recognition, and wafer alignment. Using the moiré-based alignment method, we believe the system developed has sufficient potential to be a versatile and efficient method for high-density new-generation 3D integration.
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