热点(计算机编程)
显微镜
光学
光学显微镜
亮点
强度(物理)
显微镜
视野
物理
职位(财务)
材料科学
领域(数学)
数学
扫描电子显微镜
计算机科学
纯数学
操作系统
经济
财务
作者
Yankang Wu,Pin Yang,Xing Zhang,Jianjun Dong,Jie Xu,Mingtao Li,Zhongjing Chen,Yingjie Li,Wei Jiang,Chuankui Sun,Liang Chen,Wenjie Li,Ji Yan,Yudong Pu,Yunsong Dong,Dong Yang,Feng Wang,Baozhong Mu,Zongqing Zhao
出处
期刊:AIP Advances
[American Institute of Physics]
日期:2024-08-01
卷期号:14 (8)
摘要
The Kirkpatrick–Baez (KB) microscope is an effective instrument for x-ray imaging of hot spot. However, the non-uniform distribution of response efficiency in the field of view is a drawback of the KB microscope. A more accurate hot spot image requires the correction of the measured image by combining the hot spot position and the response efficiency distribution. Here, we describe a method to locate the position of the hot spot in the field of view during hot spot imaging with a KB microscope. The position of the hot spot in the field of view can be obtained by measuring the grazing incidence angle change during hot spot imaging. In the experiment of hot spot self-emission imaging with a four-channel KB microscope, the location of the hot spot with an accuracy of 15 μm was realized, and the intensity corrected hot spot image was obtained. This will solve the problem of the non-uniform distribution of the response efficiency of the KB microscope and enable quantitative measurement of hot spot radiation intensity.
科研通智能强力驱动
Strongly Powered by AbleSci AI