光电探测器
光探测
图像传感器
光电子学
光电效应
材料科学
噪音(视频)
光电传感器
像素
暗电流
探测量子效率
信号(编程语言)
固定模式噪声
图层(电子)
光学
CMOS芯片
计算机科学
图像(数学)
物理
电气工程
图像质量
纳米技术
人工智能
工程类
程序设计语言
作者
Long Chen,Lingyu Zang,Jinchao Wu,Dongchen Tan,Zixing Li,Jinhui Song,Chengming Jiang
标识
DOI:10.1002/admt.202200707
摘要
Abstract Due to the unique structure and properties, the 2D transition metal dichalcogenides attract extensive research interest. Especially, the 2D MoS 2 film with high photoelectric response makes important research progress in the field of the photodetection and image sensing. However, at present, most of the 2D material image sensors are passive pixel structures, and the interfering noise of the external readout circuit can easily lead to a decrease in the actual detection rate of the sensors. Here, a microlithographic Y‐MoS 2 photodetector, which integrates three identical MoS 2 photosensitive units by micro‐lithographing a mono‐layer MoS 2, is reported. Compared with the MoS 2 photodetector with only one photosensitive unit, the Y‐MoS 2 photodetector has the stronger output and anti‐noise ability. In the image sensing test, the peak signal to noise ratio (PSNR) and structural similarity (SSIM) of output images are increased by ≈1.9 and 3 times, respectively. It provides a certain reference for the preparation of high‐output 2D material photodetectors by microlithography.
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