LIDD-YOLO: A Lightweight Industrial Defect Detection Network

Abstract Surface defect detection is crucial in industrial production, and due to the conveyor speed, real-time detection requires 30 to 60 Frames Per Second, which exceeds the capability of most existing methods. This demand for high FPS has driven the need for lightweight detection models. Despite significant advancements in deep learning-based detection that have enabled single-stage models such as the YOLO series to achieve relatively fast detection, existing methods still face challenges in detecting multi-scale defects and tiny defects on complex surfaces while maintaining detection speed. This study proposes a lightweight single-stage detection model called Lightweight Industrial Defect Detection Network with improved YOLO architecture for high-precision and real-time industrial defect detection. Firstly, we propose the Large Separable Kernel Spatial Pyramid Pooling module, which is a spatial pyramid pooling structure with a separable large kernel attention mechanism, significantly improving the detection rate of multi-scale defects and enhancing the detection rate of small target defects. Secondly, we improved the Backbone and Neck structure of YOLOv8n with Dual convolutional kernel Convolution and enhanced the faster implementation of Cross Stage Partial Bottleneck with 2 Convolutions (C2f) module in the Neck structure with Ghost Convolution and Decoupled Fully Connected (DFC) attention, reducing the computational and parameter overhead of the model while ensuring detection accuracy. Experimental results on the NEU-DET steel defect datasets and PCB defect datasets demonstrate that compared to YOLOv8n, LIDD-YOLO improves the recognition rate of multi-scale defects and small target defects while meeting lightweight requirements. LIDD-YOLO achieves a 3.2% increase in mean Average Precision (mAP) on the NEU-DET steel defect dataset, reaching 79.5%, and a 2.6% increase in mAP on the small target PCB defect dataset, reaching 93.3%. Moreover, it reduces the parameter count by 20.0% and Floating Point Operations by 15.5%, further meeting the requirements for lightweight and high-precision industrial defect detection models.