材料科学
压缩(物理)
断裂(地质)
复合材料
纳米技术
光电子学
作者
Sufeng Fan,Xiaocui Li,Rong Fan,Yang Lü
出处
期刊:Nanoscale
[The Royal Society of Chemistry]
日期:2020-01-01
卷期号:12 (45): 23241-23247
被引量:9
摘要
Single crystalline GaN pillars are characterized byin situcompression tests inside electron microscopes, showing distinct size-dependent fracture behavior at room temperature for potential microelectronics, power device and MEMS applications.
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