异质结
载流子
材料科学
光电子学
带隙
超快激光光谱学
吸收(声学)
扩散
二极管
光学
物理
激光器
热力学
复合材料
作者
Daria D. Blach,Weihao Zheng,Huawei Liu,Anlian Pan,Libai Huang
标识
DOI:10.1021/acs.jpcc.0c01805
摘要
Charge and energy transport across semiconducting heterointerfaces plays a central role in optoelectronic devices such as solar cells and light-emitting diodes. However, the understanding of these transport processes has been hindered by the lack of experimental tools that can provide detailed information in both spatial and temporal domains. Here, we demonstrate the use of ultrafast transient absorption microscopy to image charge dynamics and transport across semiconducting heterojunctions, using type I CdSxSe1–x lateral heterostructures as a model system. These experiments visualize carrier diffusion in the individual materials and the transmission of carriers through the interface. The carrier diffusion constant in the CdSxSe1–x alloys is measured to be around 1 cm2 s–1. Energy transfers from the higher bandgap to the lower bandgap material in ∼1 ns and the transmission of carriers across the interface is efficient with a probability of ∼80%. These results showcase the capability of transient absorption microscopy in visualizing interfacial charge transport in nanostructured heterojunctions.
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