Morphology and Growth Habit of a Novel Flux-Grown Layered Semiconductor KBiS2 Revealed by Lab-based Diffraction-Contrast Tomography

Journal Article Morphology and Growth Habit of a Novel Flux-Grown Layered Semiconductor KBiS2 Revealed by Lab-based Diffraction-Contrast Tomography Get access Kejian Qu, Kejian Qu Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL Search for other works by this author on: Oxford Academic Google Scholar Hrishikesh Bale, Hrishikesh Bale ZEISS Research Microscopy Solutions, Inc. Dublin CA Corresponding author: hrishikesh.bale@zeiss.com Search for other works by this author on: Oxford Academic Google Scholar Zachary W Riedel, Zachary W Riedel Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL Search for other works by this author on: Oxford Academic Google Scholar Junehu Park, Junehu Park Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL Search for other works by this author on: Oxford Academic Google Scholar Leilei Yin, Leilei Yin Beckman Institute, University of Illinois at Urbana-Champaign, Urbana, IL Search for other works by this author on: Oxford Academic Google Scholar André Schleife, André Schleife Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, ILNational Center for Supercomputing Applications, University of Illinois at Urbana-Champaign, Urbana, IL Search for other works by this author on: Oxford Academic Google Scholar Daniel P Shoemaker Daniel P Shoemaker Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL Corresponding author: dpshoema@illinois.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 278–279, https://doi.org/10.1017/S143192762200191X Published: 01 August 2022