结晶度
结晶
无定形固体
材料科学
聚合物
聚合物结晶
过冷
等温过程
形态学(生物学)
流变学
Crystal(编程语言)
小角X射线散射
化学工程
化学物理
散射
复合材料
结晶学
热力学
化学
光学
程序设计语言
物理
遗传学
生物
计算机科学
工程类
作者
Zefan Wang,Mareen Schäfer,Albrecht Petzold,Kay Saalwächter,Thomas Thurn‐Albrecht
标识
DOI:10.1073/pnas.2217363120
摘要
Crystallization of polymers from entangled melts generally leads to the formation of semicrystalline materials with a nanoscopic morphology consisting of stacks of alternating crystalline and amorphous layers. The factors controlling the thickness of the crystalline layers are well studied; however, there is no quantitative understanding of the thickness of the amorphous layers. We elucidate the effect of entanglements on the semicrystalline morphology by the use of a series of model blends of high-molecular-weight polymers with unentangled oligomers leading to a reduced entanglement density in the melt as characterized by rheological measurements. Small-angle X-ray scattering experiments after isothermal crystallization reveal a reduced thickness of the amorphous layers, while the crystal thickness remains largely unaffected. We introduce a simple, yet quantitative model without adjustable parameters, according to which the measured thickness of the amorphous layers adjusts itself in such a way that the entanglement concentration reaches a specific maximum value. Furthermore, our model suggests an explanation for the large supercooling that is typically required for crystallization of polymers if entanglements cannot be dissolved during crystallization.
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