碳纳米管
材料科学
透射电子显微镜
场电子发射
碳纳米管的力学性能
电子
碳纳米管的光学性质
电子显微镜
碳纤维
纳米技术
场发射显微术
纳米管
复合材料
光学
衍射
物理
量子力学
复合数
作者
Maya Doytcheva,M. Kaiser,Niels de Jonge
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2006-06-07
卷期号:17 (13): 3226-3233
被引量:43
标识
DOI:10.1088/0957-4484/17/13/025
摘要
The structural changes in carbon nanotubes under electron emission conditions were investigated in situ in a transmission electron microscope (TEM). The measurements were performed on individually mounted free-standing multi-walled carbon nanotubes (CNTs). It was found that the structure of the carbon nanotubes did not change gradually, as is the case with field emission electron sources made of sharp metal tips. Instead, changes occurred only above a current level of a few microamperes, which was different for each nanotube. Above the threshold current, carbon nanotubes underwent either structural damage, such as shortening and splitting of the apex of the nanotube, or closing of their open cap. The results are discussed on the basis of several models for degradation mechanisms.
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