石墨烯
二氟化氙
氟
材料科学
带隙
基质(水族馆)
硅
碳纤维
石墨烯纳米带
绝缘体(电)
光电子学
纳米技术
化学
无机化学
复合材料
复合数
冶金
地质学
海洋学
作者
Jeremy T. Robinson,James S. Burgess,Chad E. Junkermeier,Ştefan C. Bǎdescu,T. L. Reinecke,F. Keith Perkins,Maxim K. Zalalutdniov,Jeffrey W. Baldwin,James C. Culbertson,Paul E. Sheehan,E. S. Snow
出处
期刊:Nano Letters
[American Chemical Society]
日期:2010-07-16
卷期号:10 (8): 3001-3005
被引量:1064
摘要
Graphene films grown on Cu foils have been fluorinated with xenon difluoride (XeF(2)) gas on one or both sides. When exposed on one side the F coverage saturates at 25% (C(4)F), which is optically transparent, over 6 orders of magnitude more resistive than graphene, and readily patterned. Density functional calculations for varying coverages indicate that a C(4)F configuration is lowest in energy and that the calculated band gap increases with increasing coverage, becoming 2.93 eV for one C(4)F configuration. During defluorination, we find hydrazine treatment effectively removes fluorine while retaining graphene's carbon skeleton. The same films may be fluorinated on both sides by transferring graphene to a silicon-on-insulator substrate enabling XeF(2) gas to etch the Si underlayer and fluorinate the backside of the graphene film to form perfluorographane (CF) for which calculated the band gap is 3.07 eV. Our results indicate single-side fluorination provides the necessary electronic and optical changes to be practical for graphene device applications.
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