空间光调制器
光学
干涉测量
像素
极化(电化学)
相(物质)
光路
干扰(通信)
校准
相位调制
光路长度
液晶
材料科学
干涉显微镜
显微镜
偏振光显微镜
物理
计算机科学
相位噪声
电信
化学
频道(广播)
物理化学
量子力学
作者
Jianpei Xia,Chenliang Chang,Zhaozhong Chen,Zheyuan Zhu,Tingting Zeng,Peiying Liang,Jianping Ding
出处
期刊:Journal of Optics
[IOP Publishing]
日期:2017-09-28
卷期号:19 (12): 125701-125701
被引量:17
标识
DOI:10.1088/2040-8986/aa8fbc
摘要
As spatial light modulators (SLMs) are becoming flexible and the preferred device for light steering, the SLM's modulation calibration still remains challenging. No pixel-addressable measurement of the SLM has yet been practically implemented. We present a quantitative phase measurement and calibration method for a parallel aligned liquid crystal spatial light modulator (PAL-SLM) based on Pancharatnam phase-shifting interferometric microscopy. The pixel-wise phase of SLM can be detected from microscopic interference pattern formed from two orthogonally polarized light waves reflected off the PAL-SLM. The wave phase is modulated or non-modulated depending on its polarization direction parallel or orthogonal to the liquid crystal director. Owing to self-referencing common-path interferometric microscopic imaging, the proposed method is quite robust against environmental disturbance and enables a high-precision pixel-wise characterization of SLM.
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