开尔文探针力显微镜
非接触原子力显微镜
伏打电位
原子力声学显微镜
悬臂梁
接触带电
扫描探针显微镜
振幅
材料科学
静电力显微镜
振动
导电原子力显微镜
纳米技术
光学
声学
原子力显微镜
磁力显微镜
摩擦电效应
物理
复合材料
磁场
量子力学
磁化
作者
Shengming Li,Yusheng Zhou,Yunlong Zi,Gong Zhang,Zhong Lin Wang
出处
期刊:ACS Nano
[American Chemical Society]
日期:2016-02-03
卷期号:10 (2): 2528-2535
被引量:60
标识
DOI:10.1021/acsnano.5b07418
摘要
Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials of materials at the nanoscale, has extensive applications in characterizing the electric and electronic properties of metal, semiconductor, and insulator materials. However, it requires deep understanding of the physics of the measuring process and being able to rule out factors that may cause artifacts to obtain accurate results. In the most commonly used dual-pass KPFM, the probe works in tapping mode to obtain surface topography information in a first pass before lifting to a certain height to measure the surface potential. In this paper, we have demonstrated that the tapping-mode topography scan pass during the typical dual-pass KPFM measurement may trigger contact electrification between the probe and the sample, which leads to a charged sample surface and thus can introduce a significant error to the surface potential measurement. Contact electrification will happen when the probe enters into the repulsive force regime of a tip-sample interaction, and this can be detected by the phase shift of the probe vibration. In addition, the influences of scanning parameters, sample properties, and the probe's attributes have also been examined, in which lower free cantilever vibration amplitude, larger adhesion between the probe tip and the sample, and lower cantilever spring constant of the probe are less likely to trigger contact electrification. Finally, we have put forward a guideline to rationally decouple contact electrification from the surface potential measurement. They are decreasing the free amplitude, increasing the set-point amplitude, and using probes with a lower spring constant.
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