石墨烯
材料科学
散射
凝聚态物理
离子
电阻率和电导率
杂质
电导率
拉曼散射
载流子散射
载流子
电子迁移率
格子(音乐)
反向
拉曼光谱
物理
纳米技术
光学
几何学
量子力学
数学
声学
作者
Jianhao Chen,William Cullen,Chaun Jang,Michael S. Fuhrer,Ellen D. Williams
标识
DOI:10.1103/physrevlett.102.236805
摘要
Irradiation of graphene on ${\mathrm{SiO}}_{2}$ by 500 eV Ne and He ions creates defects that cause intervalley scattering as is evident from a significant Raman $D$ band intensity. The defect scattering gives a conductivity proportional to charge carrier density, with mobility decreasing as the inverse of the ion dose. The mobility decrease is 4 times larger than for a similar concentration of singly charged impurities. The minimum conductivity decreases proportional to the mobility to values lower than $4{e}^{2}/\ensuremath{\pi}h$, the minimum theoretical value for graphene free of intervalley scattering. Defected graphene shows a diverging resistivity at low temperature, indicating insulating behavior. The results are best explained by ion-induced formation of lattice defects that result in midgap states.
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