Surface‐enhanced resonance Raman scattering in partially oxidized thin copper film

Abstract Broad and low‐intensity Raman peaks are usually expected from nanocrystalline thin semiconductor films. The inherently weak Raman scattering phenomenon can be further deteriorated by unwanted background signals preventing the successful Raman analysis of an analyte. In this study, the resonant and surface‐enhanced Raman scattering techniques were combined to detect CuO and Cu 2 O phases in the partially oxidized nanocrystalline copper film that were otherwise undetectable. Heat treatment resulted in increased oxidation and phase transition from multiphase to single CuO phase that was in situ observed by temperature‐dependent Raman measurements. Detailed understanding of the film properties and substrate interaction was made by using several characterization techniques.