硅烷化
石英晶体微天平
原子层沉积
表面改性
X射线光电子能谱
硅烷
傅里叶变换红外光谱
三乙氧基硅烷
化学工程
化学
无机化学
材料科学
分析化学(期刊)
图层(电子)
有机化学
物理化学
吸附
工程类
作者
Vepa Rozyyev,Julia G. Murphy,Edward Barry,Anil U. Mane,S. J. Sibener,Jeffrey W. Elam
标识
DOI:10.1016/j.apsusc.2021.149996
摘要
Atomic layer deposition (ALD) is a highly versatile surface functionalization technique that can conformally coat both planar and porous substrates. Here we use ALD metal oxide layers to establish a well-defined starting surface for vapor-phase surface organic modification. Vapor-phase (3-aminopropyl)triethoxysilane (APTES) surface silanization of ALD Al2O3, ZnO and TiO2 surfaces were studied at 100 °C, 150 °C and 200 °C. In situ quartz crystal microbalance (QCM) and Fourier-transform infrared (FTIR) spectroscopy measurements, and ex situ atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) measurements showed uniform monolayer silane formation through self-limiting APTES reaction. We observed a higher surface density of grafted APTES species following silanization at 100 °C compared to 200 °C, and we attribute this to the temperature-dependent reactivity of the surface hydroxyls and changes in the mode of APTES reaction. The FTIR and XPS measurements revealed that APTES reacts with Al2O3 and ZnO exclusively through metal siloxy bond formation. However, APTES reacts with TiO2 through both siloxy bond formation and ammonium salt formation via the amine group.
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