钝化
碲化镉光电
光伏
材料科学
光电子学
载流子寿命
开路电压
碲
共发射极
光伏系统
太阳能电池
图层(电子)
量子点太阳电池
纳米技术
电压
硅
电气工程
工程类
冶金
作者
Tursun Ablekim,Joel N. Duenow,Craig L. Perkins,John Moseley,Xin Zheng,Thomas Bidaud,Berengere Frouin,Stéphane Collin,Matthew O. Reese,Mahisha Amarasinghe,Eric Colegrove,Steve Johnston,Wyatt K. Metzger
出处
期刊:Solar RRL
[Wiley]
日期:2021-05-28
卷期号:5 (8)
被引量:9
标识
DOI:10.1002/solr.202100173
摘要
CdTe photovoltaics has achieved one of the lowest levelized costs of electricity among all energy sources. However, for decades, carrier lifetimes have been inferior to those of other prevalent solar cell materials. This quality has inhibited common methods to improve solar cell efficiency such as back‐surface fields, electron reflectors, or bifacial solar cells. In this work, a significant increase in carrier lifetime to values exceeding 200 ns in fully functional CdTe solar cells is demonstrated. The increased lifetime is achieved by large CdSeTe grains at the absorber/emitter interface, intragrain passivation in the absorber layer, and chemical passivation by forming nanoscale oxidized tellurium species at the transparent conducting oxide interface. The carrier lifetime is correlated to the open‐circuit voltage and enables paths for back‐surface manipulation and novel cell architectures to further improve CdTe photovoltaic performance.
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