The most popular method to determine the sensitivity of surface plasmon resonance (SPR) sensors in the last couple of decades has been angular interrogation. The silver layer (Ag), a 2D layer of TiO 2 , and dielectric material layer such as silicon (Si) with heterostructure material graphene are all stacked in the proposed SPR sensor. To increase sensitivity of SPR sensor in the visible area, the device structure focuses on the Kretschmann configuration, by which a TiO 2 sheet is sandwiched between silver and silicon sheets. The proposed device structure makes use of the operational wavelength of 633 nm. The numerical simulation has been performed in MATLAB software in this device structure. The simulation results show that an analyte of refractive indices ranges 1.345–1.350. A single layer of silicon 3 nm and TiO 2 10 nm makes up the suggested SPR configuration, which increases the sensitivity to 281° RIU −1 . Herein, it has also been computed the figure of merit, detection accuracy, limit of detection, full width at half maximum, and transverse magnetic electric field intensity. The biomedical and chemical fields have benefited from the proposed SPR sensor structure design.