荧光寿命成像显微镜
显微镜
激发
干涉测量
荧光相关光谱
荧光
光学
费斯特共振能量转移
荧光互相关光谱
材料科学
荧光显微镜
激发态
核磁共振
共振荧光
激光诱导荧光
物理
原子物理学
量子力学
作者
Pavel Malý,Dita Strachotová,Aleš Holoubek,Petr Heřman
标识
DOI:10.1038/s41467-024-52333-2
摘要
Abstract Fluorescence lifetime imaging microscopy (FLIM) is a well-established technique with numerous imaging applications. Yet, one of the limitations of FLIM is that it only provides information about the emitting state. Here, we present an extension of FLIM by interferometric measurement of fluorescence excitation spectra. Interferometric Excitation Fluorescence Lifetime Imaging Microscopy (ixFLIM) reports on the correlation of the excitation spectra and emission lifetime, providing the correlation between the ground-state absorption and excited-state emission. As such, it extends the applicability of FLIM and removes some of its limitations. We introduce ixFLIM on progressively more complex systems, directly compare it to standard FLIM, and apply it to quantitative resonance energy transfer imaging from a single measurement.
科研通智能强力驱动
Strongly Powered by AbleSci AI