光学
材料科学
飞秒
反射计
激光器
图像分辨率
解调
分辨率(逻辑)
光纤
干涉测量
时域
物理
工程类
计算机视觉
人工智能
频道(广播)
电气工程
计算机科学
作者
Yanjie Meng,Cailing Fu,Lin Chen,Chao Du,Huajian Zhong,Yiping Wang,Jun He,Weijia Bao
出处
期刊:Optics Letters
[Optica Publishing Group]
日期:2022-11-09
卷期号:47 (23): 6289-6289
被引量:17
摘要
A φ-optical frequency domain reflectometry (OFDR) strain sensor with a submillimeter-spatial-resolution of 233 µm is demonstrated by using femtosecond laser induced permanent scatters (PSs) in a standard single-mode fiber (SMF). The PSs-inscribed SMF, i.e., strain sensor, with an interval of 233 µm exhibited a Rayleigh backscattering intensity (RBS) enhancement of 26 dB and insertion loss of 0.6 dB. A novel, to the best of our knowledge, method, i.e., PSs-assisted φ-OFDR, was proposed to demodulate the strain distribution based on the extracted phase difference of P- and S-polarized RBS signal. The maximum measurable strain was up to 1400 µε at a spatial resolution of 233 µm.
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