发光
持续发光
离子
激发态
激发
材料科学
俘获
原子物理学
晶体缺陷
价(化学)
荧光粉
化学物理
化学
光电子学
物理
结晶学
热释光
生态学
有机化学
量子力学
生物
作者
Shihang Zhou,Bibo Lou,Chong‐Geng Ma,Min Yin
标识
DOI:10.1016/j.jre.2022.07.016
摘要
LiYGeO4:Eu3+ is a red persistent luminescent material with a duration of more than 21 h. Although its persistent luminescence phenomenon has been fully studied, its detailed mechanism is still the subject of debates. Herein, we performed first-principles study on the intrinsic point defects and the charge transfer processes in LiYGeO4:Eu3+ to reveal the mechanism of persistent luminescence. The results show that, under charge transfer excitation, the electron is promoted from the valence band (oxygen ion ligand) to the central Eu3+ ion to form Eu2+ ion in LiYGeO4:Eu3+, leaving a hole behind. The charge transfer excitation can relax quickly to the excited state of the Eu3+ ion, which produces the characteristic 5D0 → 7FJ (J = 0–6) emission. The Li vacancies (VLi) and the antisite defects of Li replacing Y site (LiY) and Y replacing Li site (YLi) are main defects, while O vacancies (VO) are less important in concentration due to high formation energy. VLi and LiY can serve as hole-type traps, with the trap depths suitable for trapping the holes produced by illumination. The delayed release holes can combine with the Eu2+ left behind by the illumination, leading to persistent luminescence. The VLi trap is shallower than LiY, and the latter is responsible for the long duration of persistent luminescence. A schematic based on the calculation results is constructed to illustrate the mechanism of persistent luminescence.
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