材料科学
铁电性
光电子学
基质(水族馆)
半导体
磁滞
图层(电子)
晶体管
场效应晶体管
纳米技术
电压
电气工程
凝聚态物理
物理
地质学
工程类
电介质
海洋学
作者
Taebin Lim,Jae Heon Lee,Dong-Gyu Kim,Jinbaek Bae,Seungchae Jung,Sang Mo Yang,Joon I. Jang,Jin Jang
标识
DOI:10.1002/adma.202308301
摘要
Abstract In 2 Se 3 , 2D ferroelectric‐semiconductor, is a promising candidate for next‐generation memory device because of its outstanding electrical properties. However, the large‐area manufacturing of In 2 Se 3 is still a big challenge. In this work, spray pyrolysis technique is introduced for the growth of large‐area In 2 Se 3 thin film. A polycrystalline γ‐In 2 Se 3 layer can be grown on 15 cm × 15 cm glasss at the substrate temperature of 275 °C. The In 2 Se 3 ferroelectric‐semiconductor field effect transistor (FeS‐FET) on glass substrate demonstrates a large hysteresis window of 40.3 V at the ±40 V of gate voltage sweep and excellent uniformity. The FeS‐FET exhibits an electron field effect mobility of 0.97 cm 2 V −1 s −1 and an on/off current ratio of >10 7 in the transfer curves. The memory behavior of the large‐area, In 2 Se 3 FeS‐FETs for next‐generation memory is demonstrated.
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