球栅阵列
材料科学
电镀(地质)
冶金
镍
图层(电子)
电子包装
可靠性(半导体)
焊接
复合材料
地球物理学
量子力学
物理
地质学
功率(物理)
作者
Seok-Phyo Tchun,Joo-Yeop Kim,Arun Raj
标识
DOI:10.1109/eptc56328.2022.10013134
摘要
In the electronic packaging industry, for the past few decades, ENEPIG(Electroless Nickel Electroless Palladium Immersion Gold) plating method has been already widely used for substrates of many different LGA and BGA packages. However, because of chronic quality issues of laminate manufacturing process such as discoloration and corrosion induced from very long process time of Nickel layer plating process, there is a strong demand from laminate substrate suppliers of changing the Nickel layer thickness range from thick 3∼8um to thin 0.08∼0.2um, In this study, we tried to verify the board level reliability performance of Thin Nickel plating ENEPIG laminate packages, comparing with current Thick Nickel plating ENEPIG laminate packages, also compared the performance between LGA and BGA packages.
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