Lv5
1280 积分 2023-12-18 加入
Investigation of Nitrogen-Originated NBTI Mechanism in SiON with High-Nitrogen Concentration
27天前
已完结
Dependence of oxide defect generation on oxidation temperature for dry oxidation of silicon
2个月前
已关闭
p-type behavior in In–N codoped ZnO thin films
3个月前
已完结
Effect of moisture on the Time Dependent Dielectric Breakdown (TDDB) behavior in an ultra-low-k (ULK) dielectric
4个月前
已完结
Process optimization of a deep trench isolation structure for high voltage SOI devices
4个月前
已关闭
Characterization and comparison of two metal-insulator-metal capacitor schemes in 0.13 μm copper dual damascene metallization process for mixed-mode and RF applications
4个月前
已完结
Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator
6个月前
已完结
Defect Localization on MIM Capacitor Array by Circuit Edit using Focused-Ion Beam (FIB)
6个月前
已完结
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