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40 积分 2024-11-11 加入
Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning
12天前
已完结
Deep‐Learning‐Enabled Fast Optical Identification and Characterization of 2D Materials
13天前
已完结
Collaborative representation based unsupervised CNN for hyperspectral anomaly detection
13天前
已完结
Automated identification and characterization of two-dimensional materials via machine learning-based processing of optical microscope images
13天前
已完结
Efficient Dual Attention Based Knowledge Distillation Network for Unsupervised Wafer Map Anomaly Detection
13天前
已完结
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