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40 积分 2024-07-21 加入
Thickness and refractive index measurements of a thin-film using an artificial neural network algorithm
2小时前
求助中
Atomic Layer Deposition Beyond Thin Film Deposition Technology
3个月前
已完结
A Simple Approach to Multilayer Thin Film Analysis Based on Theoretical Calculations Using Fundamental Parameters Method
6个月前
已完结
New Developments in FP-Based Software for Both Bulk and Thin-Film XRF Analysis
6个月前
已完结
Recent Developments in X‐Ray Fluorescence for Characterization of Nano‐Structured Materials
6个月前
已完结
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