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PualYoung
Lv1
20 积分
2025-01-14 加入
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Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
18小时前
待确认
Effect of brush cleaning on defect generation in post copper CMP
11天前
已完结
Energy Efficient Computing With High-Density, Field-Free STT-Assisted SOT-MRAM (SAS-MRAM)
23天前
已完结
A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement
24天前
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Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM
24天前
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Development and Comprehensive Evaluation of TMR Sensor-Based Magnetrodes
1个月前
已完结
Reliable Memory Operation with Low Read Disturb Rate in the World Smallest 1Selector-1MTJ Cell for 64 Gb Cross-Point MRAM
1个月前
已完结
Methods of Reducing Metal Damager Defect in Back End of Line for Semiconductor in 28Nm Technology
1个月前
已完结
Design Space Analysis for Cross-Point 1S1MTJ MRAM: Selector–MTJ Cooptimization
1个月前
已完结
Spin-orbit torque switching of magnetic tunnel junctions for memory applications
3个月前
已完结
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