多铁性
分压
外延
薄膜
压电响应力显微镜
透射电子显微镜
材料科学
焊剂(冶金)
图层(电子)
氧气
分析化学(期刊)
相(物质)
纳米技术
化学工程
化学
光电子学
铁电性
冶金
电介质
工程类
有机化学
色谱法
作者
Varatharajan Anbusathaiah,Ching Cheng,Sung Hwan Lim,Makoto Murakami,L. Salamanca‐Riba,Ichiro Takeuchi,V. Nagarajan
摘要
Multiferroic BiFeO3 (BFO) thin films have been fabricated via flux mediated epitaxy with varying oxygen partial pressure and flux composition (Bi2O3:CuO) conditions. Transmission electron microscopy coupled with energy dispersive x-ray spectroscopy as well as piezoresponse force microscopy confirm, that with the correct flux and seed layer conditions, even at very low partial pressures (3mTorr) no secondary phases are formed. The study reveals the crucial role of the bottom seed layer and flux chemistry in epitaxy of BFO thin films and provides alternate routes to BFO epitaxy in oxygen-deficient environments.
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