材料科学
结晶度
高分辨率透射电子显微镜
薄膜
带隙
透射率
铋
光电子学
光学
纳米技术
复合材料
透射电子显微镜
冶金
物理
作者
A.M. Adam,A.K. Diab,Mohamed Tolan,Zainab Mufarreh Elqahtani,Ahmed Refaat,Medhat A. El-Hadek,E.M. Elsehly,A. El-Khouly,Abdulaziz N. Alharbi,Vladimir Khovaylo,M. Ataalla
标识
DOI:10.1016/j.mssp.2022.106557
摘要
Thin layers of (Bi2Se3)1-x(Bi2Te3)x samples were prepared by vacuum thermal evaporation technique. Starting materials are bulk alloys of good crystallinity. Characterization and optical properties of the synthesized films are discussed. Structure properties, surface features and roughness of the deposited films are probed via XRD, SEM and HRTEM techniques, which confirmed perfect crystallinity and nano-scalability of the samples. Transmission and reflection spectra attested that all prepared films have a growing transparency upon increasing the wavelength beyond the infra-red region, with optical band gap energy varies between 0.72 and 0.91 eV. Interesting absorption is detected in the visible light region. Enhancement of light transmission in layered bismuth chalcogenides is achieved through incorporation of Bi2Te3 into the (Bi2Se3)1-x(Bi2Te3)x system at x = 0.20. A maximum transmittance of 81.5% was observed in the IR region. The concerned materials showed high interest for transparent and highly conductive electrodes and also for flexible electronic devices.
科研通智能强力驱动
Strongly Powered by AbleSci AI