计算机科学
离群值
特征(语言学)
模式识别(心理学)
人工智能
回归
可视化
特征提取
异常检测
数据挖掘
机器学习
数学
统计
哲学
语言学
作者
Binhui Liu,Tianchu Guo,Bin Luo,Zhen Cui,Jian Yang
出处
期刊:IEEE transactions on image processing
[Institute of Electrical and Electronics Engineers]
日期:2024-01-01
卷期号:33: 5183-5193
标识
DOI:10.1109/tip.2024.3457236
摘要
Defect detection from images is a crucial and challenging topic of industry scenarios due to the scarcity and unpredictability of anomalous samples. However, existing defect detection methods exhibit low detection performance when it comes to small-size defects. In this work, we propose a Cross-Attention Regression Flow (CARF) framework to model a compact distribution of normal visual patterns for separating outliers. To retain rich scale information of defects, we build an interactive cross-attention pattern flow module to jointly transform and align distributions of multi-layer features, which is beneficial for detecting small-size defects that may be annihilated in high-level features. To handle the complexity of multi-layer feature distributions, we introduce a layer-conditional autoregression module to improve the fitting capacity of data likelihoods on multi-layer features. By transforming the multi-layer feature distributions into a latent space, we can better characterize normal visual patterns. Extensive experiments on four public datasets and our collected industrial dataset demonstrate that the proposed CARF outperforms state-of-the-art methods, particularly in detecting small-size defects.
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