光学
探测器
光子计数
光子
航程(航空)
材料科学
灵敏度(控制系统)
X射线
X射线探测器
物理
电子工程
工程类
复合材料
作者
E. B. Saloman,Jay Pearlman,Burton L. Henke
出处
期刊:Applied optics
[The Optical Society]
日期:1980-03-01
卷期号:19 (5): 749-749
被引量:20
摘要
The photoefficiency of CsI and CuI photocathodes was measured for photons in the 22–240-eV (50–560-Å) energy range. The within-batch and batch-to-batch variation in photoefficiency were studied as was the sensitivity of the samples to storage under dry nitrogen. The effect of exposure to air was investigated. The shape of the photoefficiency curves was found to agree quite well with that expected from the photoabsorption cross sections of the materials. CsI in particular appears useful as a detector in soft x-ray diagnostics, especially as a narrowband detector in the 100-eV photon energy range where peak measured efficiencies can exceed 300%.
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