材料科学
各向异性
透射率
拉曼光谱
钛
半导体
吸收(声学)
光谱学
图层(电子)
光电子学
光学
纳米技术
复合材料
量子力学
物理
冶金
作者
Joshua O. Island,Robert Biele,Mariam Barawi,José M. Clamagirand,J.R. Ares,C. Sánchez,Herre S. J. van der Zant,Isabel J. Ferrer,Roberto D’Agosta,Andrés Castellanos-Gómez
摘要
Abstract We present characterizations of few-layer titanium trisulfide (TiS 3 ) flakes which, due to their reduced in-plane structural symmetry, display strong anisotropy in their electrical and optical properties. Exfoliated few-layer flakes show marked anisotropy of their in-plane mobilities reaching ratios as high as 7.6 at low temperatures. Based on the preferential growth axis of TiS 3 nanoribbons, we develop a simple method to identify the in-plane crystalline axes of exfoliated few-layer flakes through angle resolved polarization Raman spectroscopy. Optical transmission measurements show that TiS 3 flakes display strong linear dichroism with a magnitude (transmission ratios up to 30) much greater than that observed for other anisotropic two-dimensional (2D) materials. Finally, we calculate the absorption and transmittance spectra of TiS 3 in the random-phase-approximation (RPA) and find that the calculations are in qualitative agreement with the observed experimental optical transmittance.
科研通智能强力驱动
Strongly Powered by AbleSci AI