荧光
校准
激发
基质(化学分析)
化学
分析化学(期刊)
材料科学
色谱法
光学
物理
量子力学
作者
Yue Chen,Hai‐Long Wu,Tong Wang,Ru‐Qin Yu
标识
DOI:10.1016/j.microc.2024.110053
摘要
In this work, a calibration model transfer method based on quadrilinear model for excitation-emission matrix fluorescence (EEM) data measurements on different fluorescence spectrophotometers was proposed. The proposed method can realize the calibration model transfer of EEM data on different fluorescence spectrophotometers through only one modeling, provided that the shape of the fluorescence spectrum of each target analyte in these data does not change significantly. The calibration sample data acquired on the 2nd or 3rd instrument was transposed to that obtained from the 1st instrument using the calibration model transfer. Subsequently, the transferred data was used to build a calibration model and it was employed to predict the results of spiked prediction samples obtained from the 1st instrument. The reliability of the method was demonstrated through the simulated EEM data and the real EEM data that came from three different fluorescence spectrophotometers (HITACHI F-7000, Edinburgh FS5 and HITACHI F-4600). In addition, when unknown interference was accidentally introduced during the measurement process of calibration samples, this method support the elimination of interference before implementing AQLD and subsequent calibration model transfer was not affected. The obtained EEM data after the calibration model transfer could be combined with the second-order calibration algorithm for the quantitative analysis of target analytes in complex systems.
科研通智能强力驱动
Strongly Powered by AbleSci AI