感应耦合等离子体
锡
等离子体原子发射光谱
分析化学(期刊)
标准物质
溶解
电感耦合等离子体质谱法
化学
原子发射光谱法
焊接
材料科学
质谱法
冶金
检出限
等离子体
环境化学
色谱法
物理
物理化学
量子力学
出处
期刊:Chimia
日期:1994-06-29
卷期号:48 (6): 213-213
被引量:4
标识
DOI:10.2533/chimia.1994.213
摘要
The quality control of the chemical composition of tin-lead solder is one of the routine analytical applications in the department of inorganic chemistry. A rapid and reliable method of analysis was established by use of the inductively coupled plasma atomic emission spectrometry (ICP-AES), which allows multielement quantitative determination of the impurities below criteria levels, as well as the determination of the major elements in solder. The most difficult part of the method remains the solder disintegration, as the dissolution of tin and lead together is a difficult chemical procedure. The samples were dissolved in a mixture of HCl and HNO3. A 4 g/l solder solution was found to be suitable for analyzing traces of Ag, Al, As, Au, Bi, Cd, Cu, Fe, In, Ni, Sb, and Zn with a better precision and accuracy compared to the combined spark-ICP AES method used previously. The results for Sn and Pb obtained with dilute solutions were in good agreement with those obtained by the wet chemical methods. Spectral interferences from Sn and Pb, as well as matrix effects were found to be negligible for most of the trace elements. The reliability of the analytical results achieved in routine programs was proved with commercially certified reference materials. The discrepancies found for some elements between the certified mean values and the ICP results are discussed.
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