光刻胶
抵抗
傅里叶变换红外光谱
甲基丙烯酸缩水甘油酯
凝胶渗透色谱法
苯酚
紫外线
甲基丙烯酸酯
试剂
材料科学
化学
核化学
高分子化学
化学工程
聚合物
有机化学
聚合
光电子学
图层(电子)
工程类
作者
Junjun Liu,Wenbing Kang
出处
期刊:Polymers
[MDPI AG]
日期:2023-03-23
卷期号:15 (7): 1598-1598
被引量:2
标识
DOI:10.3390/polym15071598
摘要
In this paper, a chemically amplified (CA) i-line photoresist system is described including a phenolic resin modified with glycidyl methacrylate (GMA) addition and protected with di-tert-butyl dicarbonate (BOC group), here called JB resin. JB resin with different degrees of BOC protection was synthesized and characterized with ultraviolet spectrophotometry, Fourier transform infrared spectroscopy and gel permeation chromatography. These resins were also evaluated in CA resists by formulating the JB resin with a photoacid generator (PAG) and tested at 405 nm and 365 nm exposure wavelengths. The BOC protection ratio at approximately 25 mol% of the Novolak phenol group showed the best performance. The resist showed high sensitivity (approximately 190 mJ/cm2), high resolution and good alkali developer resistance with reliable repeatability, indicating the great practical potential of this JB resist system.
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