折射率
插值(计算机图形学)
平滑的
期限(时间)
光学
航程(航空)
数学
标准差
材料科学
统计
计算机科学
物理
量子力学
复合材料
动画
计算机图形学(图像)
出处
期刊:Journal of the Optical Society of America
[The Optical Society]
日期:1967-05-01
卷期号:57 (5): 674-674
被引量:75
标识
DOI:10.1364/josa.57.000674
摘要
The advantages of a four-term Sellmeier-equation fit to refractive indexes of recently produced fused silica are described. The four-term fit gives more accurate smoothing and interpolation of data than the three-term fit used previously and also indicates data of questionable accuracy. After the suspect data had been eliminated, fits with an average deviation of 4.3 · 10−6 were obtained with both three- and four-term equations over the range 0.21–2.32 μ.
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