德国的
光学(聚焦)
图书馆学
引用
法拉第笼
艺术史
物理
哲学
计算机科学
艺术
语言学
光学
量子力学
磁场
标识
DOI:10.1046/j.1365-2818.2002.01042.x
摘要
Journal of MicroscopyVolume 207, Issue 2 p. 154-154 Image reconstruction by means of focus series1 P. Schiske, P. Schiske Institute of Electron Microscopy, Fritz-Haber Institute, Max-Planck Society, Faraday Weg 4–6, Berlin-Dahlem, GermanySearch for more papers by this author P. Schiske, P. Schiske Institute of Electron Microscopy, Fritz-Haber Institute, Max-Planck Society, Faraday Weg 4–6, Berlin-Dahlem, GermanySearch for more papers by this author First published: 05 August 2002 https://doi.org/10.1046/j.1365-2818.2002.01042.xCitations: 21 Emeritus Professor E. Zeitler. E-mail: [email protected] 1 At the suggestion of Elmar Zeitler, Peter Schiske has agreed to republish this abstract in English in order to make it more widely accessible; originally in German, it first appeared in the Proceedings of the Fourth Regional Congress on Electron Microscopy, Rome 1968 , vol. 1, pp. 145–146. The method has been widely applied and extended and has produced remarkable results. Many users of the method are, however, unaware of its origin and this abstract has been unjustly neglected. The willingness of the editor of the Journal of Microscopy to print this translation is gratefully acknowledged. Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL No abstract is available for this article.Citing Literature Volume207, Issue2August 2002Pages 154-154 RelatedInformation
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