XRF topography information: Simulations and data from a novel silicon drift detector system

This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3] (Elettra Sincrotrone Trieste, Trieste, Italy).