原子层沉积
燃烧化学气相沉积
化学气相沉积
薄膜
沉积(地质)
材料科学
图层(电子)
离子镀
纳米技术
混合物理化学气相沉积
化学工程
碳膜
脉冲激光沉积
古生物学
沉积物
工程类
生物
出处
期刊:Journal of vacuum science & technology
[American Institute of Physics]
日期:2003-09-01
卷期号:21 (5): S88-S95
被引量:125
摘要
This article provides a brief overview of thin film growth utilizing the reactive processes of chemical vapor deposition (CVD) and atomic layer deposition (ALD). In CVD, thin films are deposited upon the chemical reaction of vapor phase precursors with a solid surface. ALD is a surface reaction-controlled variant of CVD in which the chemical precursors are introduced in a sequential, pulsed manner, resulting in the growth of a self-limited monolayer (or less) film for each pulse step. The aim of both methodologies is the controlled growth of thin films with desired and reproducible properties. Emphasis is given to the latest advancements and future directions, and the processes and precursors commonly used to achieve controlled deposition.
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