近场扫描光学显微镜
材料科学
纳米技术
纳米
光谱学
光学显微镜
扫描探针显微镜
显微镜
扫描电子显微镜
光学
物理
量子力学
复合材料
作者
Xinzhong Chen,Suheng Xu,Sara Shabani,Yueqi Zhao,Matthew Fu,Andrew J. Millis,M. M. Fogler,Abhay N. Pasupathy,Mengkun Liu,D. N. Basov
标识
DOI:10.1002/adma.202109171
摘要
Abstract The ability to perform nanometer‐scale optical imaging and spectroscopy is key to deciphering the low‐energy effects in quantum materials, as well as vibrational fingerprints in planetary and extraterrestrial particles, catalytic substances, and aqueous biological samples. These tasks can be accomplished by the scattering‐type scanning near‐field optical microscopy (s‐SNOM) technique that has recently spread to many research fields and enabled notable discoveries. Herein, it is shown that the s‐SNOM, together with scanning probe research in general, can benefit in many ways from artificial‐intelligence (AI) and machine‐learning (ML) algorithms. Augmented with AI‐ and ML‐enhanced data acquisition and analysis, scanning probe optical nanoscopy is poised to become more efficient, accurate, and intelligent.
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