材料科学
接触电阻
晶体管
接口(物质)
纳米尺度
实现(概率)
超材料
CMOS芯片
光电子学
量子
纳米技术
图层(电子)
接触角
复合材料
物理
量子力学
电压
统计
坐滴法
数学
作者
Chih-Hung Chung,Ting Yu Chen,Chin-Teng Lin,Hung‐Chang Chien
标识
DOI:10.1088/1361-6528/ad1afa
摘要
The realization of n- and p-type TMD-based field-effect transistors for nanoscale CMOS applications remains challenging owing to undesirable contact resistance. Quantum-transport calculations were performed by replacing single-sided of Se atoms of TMD near the interface with As or Br atoms to further improve the contact resistance. Here partial selenium replacement produced a novel interface with a segment of metamaterial MoSeX (Pt/MoSeX/MoSe2; X=As, Br). Such stable metamaterials exhibit semi-metallicity and the contact resistance can thus be lowered. Our findings provide insights into the potential of MoSe2-based nano-CMOS logic devices.
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