聚醚酰亚胺
X射线光电子能谱
化学计量学
材料科学
聚合物
单色
激发
谱线
离域电子
分析化学(期刊)
物理化学
复合材料
核磁共振
化学
有机化学
光学
物理
量子力学
天文
作者
Michael C. Burrell,John J. Chera
摘要
A spin cast film of polyetherimide (Ultem® 1000, GE Plastics) was analyzed by XPS using monochromatic Al Kα excitation. The measured atomic composition closely matched the expected stoichiometry of the polymer. Peak positions of the individual chemically shifted C 1s, O 1s, and N 1s components are reported. The results are in general agreement with other reported spectra of polyetherimide polymers: experimental, C 83.0%, O 12.9%, and N 4.1%; theoretical, C 82.2%, O 13.3%, and N 4.3%.
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